Your selections:
Internal model control for spiral trajectory tracking with MEMS AFM scanners
- Bazaei, Ali, Maroufi, Mohammad, Fowler, Anthony G., Moheimani, S. O. Reza
Combining spiral scanning and internal model control for sequential AFM imaging at video rate
- Bazaei, Ali, Yong, Yuen Kuan, Moheimani, S. O. Reza
Fast spiral-scan atomic force microscopy
- Mahmood, I. A., Moheimani, S. O. Reza
Spiral-scan atomic force microscopy: a constant linear velocity approach
- Mahmood, Iskandar A., Moheimani, S. O. Reza
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